Production Test Challenges And Possible Solutions For Multiple GB/s ICs

As the data rate reaches 1 Gb/s or beyond, most of the communication standards use the serial link architecture due to its capability of delivering data at a rate up to 100 Gb/s and beyond. This serial link is an asynchronized system with a bit clock embedded in the transmitting data bit stream. Transmitting multiple Gb/s data for a single channel over a distance of ~10 m < L < a few 1000 km are all serial, with standard examples of Giga Bit Ethernet (GBE), Fibre Channel (FC), and SONET. The transmitter, receiver, and transceiver ICs for those communication links are characterized by fiber medium, high cost, low volume, and limited integration in comparison with the mainstream commodity ICs. The production test for those ICs are often conducted with rack-and-stack of certain lab instruments, or some home-grown testers, resulting in a high cost, low throughput test solution. Such a production test solution is not favored, but may still be justifiable given the mean high unit sale price for those ICs (> $1000/device).